A review of demodulation techniques for multifrequency atomic force microscopy

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Location: Deutsche Nationalbibliothek Frankfurt am Main

Extent: Online-Ressource

Language: Englisch

Bibliographic citation: A review of demodulation techniques for multifrequency atomic force microscopy ; volume:11 ; pages:76-91
Beilstein journal of nanotechnology ; 11, 76-91

Classification: Ingenieurwissenschaften und Maschinenbau

DOI: 10.3762/bjnano.11.8

URN: urn:nbn:de:101:1-2020112714492712592866

Rights: Der Zugriff auf das Objekt ist unbeschränkt möglich.

Last update: 15.08.2025, 7:25 AM CEST

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A review of demodulation techniques for multifrequency atomic force microscopy

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Other Objects (12)

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