Multi-frequency tapping-mode atomic force microscopy beyond three eigenmodes in ambient air
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Extent
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Online-Ressource
- Bibliographic citation
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Multi-frequency tapping-mode atomic force microscopy beyond three eigenmodes in ambient air ; volume:5 ; pages:1637-1648
Beilstein journal of nanotechnology ; 5, 1637-1648
- Classification
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Ingenieurwissenschaften und Maschinenbau
- DOI
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10.3762/bjnano.5.175
- URN
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urn:nbn:de:101:1-2015012826728
- Rights
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Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
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15.08.2025, 7:26 AM CEST
Data provider
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Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
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