In-circuit-measurement of parasitic elements in high gain high bandwidth low noise transimpedance amplifiers
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Extent
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Online-Ressource
- Language
-
Englisch
- Bibliographic citation
-
In: Cochems, P.; Kirk, A.T.; Zimmermann, S.: In-circuit-measurement of parasitic elements in high gain high bandwidth low noise transimpedance amplifiers. In: Review of Scientific Instruments 85 (2014), 124703. DOI: https://doi.org/10.1063/1.4902854
- Classification
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Elektrotechnik, Elektronik
- Event
-
Veröffentlichung
- (where)
-
Hannover
- (who)
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Gottfried Wilhelm Leibniz Universität Hannover
- (when)
-
2014
- Event
-
Veröffentlichung
- (where)
-
Hannover
- (who)
-
Technische Informationsbibliothek (TIB)
- (when)
-
2014
- Creator
-
Cochems, P.
- DOI
-
10.15488/4415
- URN
-
urn:nbn:de:101:1-2020061910421917944962
- Rights
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
14.08.2025, 11:00 AM CEST
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Cochems, P.
- Gottfried Wilhelm Leibniz Universität Hannover
- Technische Informationsbibliothek (TIB)
Time of origin
- 2014
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