In-circuit-measurement of parasitic elements in high gain high bandwidth low noise transimpedance amplifiers
- Standort
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Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
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Online-Ressource
- Sprache
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Englisch
- Erschienen in
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In: Cochems, P.; Kirk, A.T.; Zimmermann, S.: In-circuit-measurement of parasitic elements in high gain high bandwidth low noise transimpedance amplifiers. In: Review of Scientific Instruments 85 (2014), 124703. DOI: https://doi.org/10.1063/1.4902854
- Klassifikation
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Elektrotechnik, Elektronik
- Ereignis
-
Veröffentlichung
- (wo)
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Hannover
- (wer)
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Gottfried Wilhelm Leibniz Universität Hannover
- (wann)
-
2014
- Ereignis
-
Veröffentlichung
- (wo)
-
Hannover
- (wer)
-
Technische Informationsbibliothek (TIB)
- (wann)
-
2014
- Urheber
-
Cochems, P.
- DOI
-
10.15488/4415
- URN
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urn:nbn:de:101:1-2020061910421917944962
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
14.08.2025, 11:00 MESZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
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Beteiligte
- Cochems, P.
- Gottfried Wilhelm Leibniz Universität Hannover
- Technische Informationsbibliothek (TIB)
Entstanden
- 2014
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