In-circuit-measurement of parasitic elements in high gain high bandwidth low noise transimpedance amplifiers
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
-
Online-Ressource
- Sprache
-
Englisch
- Erschienen in
-
In: Cochems, P.; Kirk, A.T.; Zimmermann, S.: In-circuit-measurement of parasitic elements in high gain high bandwidth low noise transimpedance amplifiers. In: Review of Scientific Instruments 85 (2014), 124703. DOI: https://doi.org/10.1063/1.4902854
- Klassifikation
-
Elektrotechnik, Elektronik
- Ereignis
-
Veröffentlichung
- (wo)
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Hannover, Hannover
- (wer)
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Gottfried Wilhelm Leibniz Universität Hannover, Technische Informationsbibliothek (TIB)
- (wann)
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2014
- Urheber
-
Cochems, P.
- DOI
-
10.15488/4415
- URN
-
urn:nbn:de:101:1-2020061910421917944962
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
25.03.2025, 13:48 MEZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
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Beteiligte
- Cochems, P.
- Gottfried Wilhelm Leibniz Universität Hannover, Technische Informationsbibliothek (TIB)
Entstanden
- 2014
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