Diagnostic of graphene on Ge(100)/Si(100) in a 200 mm wafer Si technology environment by spectroscopic ellipsometry/reflectometry
- Sprache
-
Englisch
- Identifier
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1257964712
Beteiligte Personen und Organisationen
Fursenko, Oksana
Lukosius, Mindaugas
Bauer, Joachim
Villringer, Claus
Lux, Helge
Bärwolf, Florian
Lisker, Marco
Mai, Andreas
Lukosius, Mindaugas
Bauer, Joachim
Villringer, Claus
Lux, Helge
Bärwolf, Florian
Lisker, Marco
Mai, Andreas
- URN
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
07.06.2022, 09:55 MESZ
Beteiligte
- Fursenko, Oksana
- Lukosius, Mindaugas
- Bauer, Joachim
- Villringer, Claus
- Lux, Helge
- Bärwolf, Florian
- Lisker, Marco
- Mai, Andreas
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