Engineering shallow and deep level defects in κ-Ga2O3 thin films: comparing metal-organic vapour phase epitaxy to molecular beam epitaxy and the effect of annealing treatments
- Standort
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Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
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Online-Ressource
- Sprache
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Englisch
- Erschienen in
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In: 10.1016/j.mtphys.2024.101463
- Ereignis
-
Veröffentlichung
- (wo)
-
Aachen
- (wer)
-
Universitätsbibliothek der RWTH Aachen
- (wann)
-
2024
- Urheber
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Mazzolini, P.
Varley, J. B.
Parisini, A.
Sacchi, A.
Pavesi, M.
Bosio, A.
Bosi, M.
Seravalli, L.
Janzen, B. M.
Marggraf, M. N.
Bernhardt, N.
Wagner, M. R.
Ardenghi, A.
Bierwagen, O.
Falkenstein, Andreas
Kler, Joe
De Souza, Roger A.
Martin, Manfred
Mezzadri, F.
Borelli, C.
Fornari, R.
- DOI
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10.18154/RWTH-2025-00081
- URN
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urn:nbn:de:101:1-2502200044155.261425104268
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
15.08.2025, 07:23 MESZ
Datenpartner
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Beteiligte
- Mazzolini, P.
- Varley, J. B.
- Parisini, A.
- Sacchi, A.
- Pavesi, M.
- Bosio, A.
- Bosi, M.
- Seravalli, L.
- Janzen, B. M.
- Marggraf, M. N.
- Bernhardt, N.
- Wagner, M. R.
- Ardenghi, A.
- Bierwagen, O.
- Falkenstein, Andreas
- Kler, Joe
- De Souza, Roger A.
- Martin, Manfred
- Mezzadri, F.
- Borelli, C.
- Fornari, R.
- Universitätsbibliothek der RWTH Aachen
Entstanden
- 2024
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