Doping and thickness variation influence on the structural and sensing properties of NiO film prepared by RF-magnetron sputtering
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- ISSN
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1573-482X
- Extent
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Online-Ressource
- Language
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Englisch
- Notes
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online resource.
- Bibliographic citation
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Doping and thickness variation influence on the structural and sensing properties of NiO film prepared by RF-magnetron sputtering ; volume:27 ; number:2 ; day:28 ; month:10 ; year:2015 ; pages:1270-1277 ; date:2.2016
Journal of materials science / Materials in electronics ; 27, Heft 2 (28.10.2015), 1270-1277, 2.2016
- Creator
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Hassan, Ehssan Salah
Saeed, Asrar Abdulmunem
Elttayef, Abdulhussain K.
- Contributor
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SpringerLink (Online service)
- DOI
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10.1007/s10854-015-3885-3
- URN
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urn:nbn:de:101:1-2019120205523962950573
- Rights
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Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
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14.08.2025, 10:52 AM CEST
Data provider
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Associated
- Hassan, Ehssan Salah
- Saeed, Asrar Abdulmunem
- Elttayef, Abdulhussain K.
- SpringerLink (Online service)
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