Characterization of parasitic effects in integrated semiconductor devices with contactless fault isolation techniques
- Alternative title
-
Charakterisierung von parasitären Effekten in integrierten Halbleiterbauelementen mit Hilfe kontaktloser Fehlerdetektionsverfahren
- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- Extent
-
Online-Ressource
- Language
-
Englisch
- Notes
-
Berlin, Technische Universität Berlin, Dissertation, 2021
- Classification
-
Elektrotechnik, Elektronik
- Keyword
-
Semiconductors
- Event
-
Veröffentlichung
- (where)
-
Berlin
- (who)
-
Technische Universität Berlin
- (when)
-
2022
- Creator
- Contributor
-
Boit, Christian
Szyszka, Bernd
Asadi, Navid
- DOI
-
10.14279/depositonce-14808
- Handle
-
11303/16034
- URN
-
urn:nbn:de:101:1-2022031600594371361504
- Rights
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
15.08.2025, 7:24 AM CEST
Data provider
This object is provided by:
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Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Beyreuther, Anne
- Boit, Christian
- Szyszka, Bernd
- Asadi, Navid
- Technische Universität Berlin
Time of origin
- 2022
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