Improved conductivity-measurement of semiconductor epitaxial layers by means of the contactless microwave method
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
-
Online-Ressource
- Sprache
-
Englisch
- Anmerkungen
-
In: Millimeter and Submillimeter Waves and Applications : proceedings of the International Conference on Millimeter and Submillimeter Waves and Applications, 10 - 14 January 1994, San Diego, California / Mohammed N. Afsar. - Bellingham u.a. : SPIE, 1994. - ISBN: 0-8194-1515-4. - (SPIE:2211) 649-658
- Klassifikation
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Physik
- Schlagwort
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Millimeterwelle
Kongreß
San Diego
1994>
- Ereignis
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Veröffentlichung
- (wo)
-
Würzburg
- (wer)
-
Universität Würzburg
- (wann)
-
2009
- Beteiligte Personen und Organisationen
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Boege, P.
Schäfer, H.
Shanjia, Xu
Xinzhang, Wu
Einfeldt, S.
Becker, Charles R.
Hommel, D.
Geick, R.
- URN
-
urn:nbn:de:bvb:20-opus-37763
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
14.08.2025, 10:46 MESZ
Datenpartner
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Beteiligte
- Boege, P.
- Schäfer, H.
- Shanjia, Xu
- Xinzhang, Wu
- Einfeldt, S.
- Becker, Charles R.
- Hommel, D.
- Geick, R.
- Universität Würzburg
Entstanden
- 2009
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Microwave semiconductor devices
Optical Characterization of epitaxial semiconductor layers
Epitaxial semiconductor nanostructure growth with templates
Contactless conductivity measurements on La2CuO4 at radio frequencies
Contactless monitoring of the diameter-dependent conductivity of GaAs nanowires
Microwave conductivity investigations in plastically deformed silicon
Microwave and millimeter-wave interferometers for contactless characterization of dielectric biomedical samples
Microwave semiconductor devices : theory, technology and performance
Development of a contactless conductivity sensor in flowing micro systems for cerium nitrate
In–situ strain control in epitaxial silicon carbide compound semiconductor
Characterization of parasitic effects in integrated semiconductor devices with contactless fault isolation techniques
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Microwave semiconductor devices
Optical Characterization of epitaxial semiconductor layers
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Contactless monitoring of the diameter-dependent conductivity of GaAs nanowires
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