Characterization of parasitic effects in integrated semiconductor devices with contactless fault isolation techniques
- Weitere Titel
-
Charakterisierung von parasitären Effekten in integrierten Halbleiterbauelementen mit Hilfe kontaktloser Fehlerdetektionsverfahren
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
-
Online-Ressource
- Sprache
-
Englisch
- Anmerkungen
-
Berlin, Technische Universität Berlin, Dissertation, 2021
- Klassifikation
-
Elektrotechnik, Elektronik
- Schlagwort
-
Semiconductors
- Ereignis
-
Veröffentlichung
- (wo)
-
Berlin
- (wer)
-
Technische Universität Berlin
- (wann)
-
2022
- Urheber
- Beteiligte Personen und Organisationen
-
Boit, Christian
Szyszka, Bernd
Asadi, Navid
- DOI
-
10.14279/depositonce-14808
- Handle
-
11303/16034
- URN
-
urn:nbn:de:101:1-2022031600594371361504
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
15.08.2025, 07:24 MESZ
Datenpartner
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Beteiligte
- Beyreuther, Anne
- Boit, Christian
- Szyszka, Bernd
- Asadi, Navid
- Technische Universität Berlin
Entstanden
- 2022
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