Characterization of grain boundaries in multicrystalline silicon with high lateral resolution using conductive atomic force microscopy
- Standort
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Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
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Online-Ressource
- Sprache
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Englisch
- Erschienen in
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In: Journal of Applied Physics 112.3 (2012): 07.11.2012
- Klassifikation
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Physik
- Schlagwort
-
-
- Ereignis
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Veröffentlichung
- (wo)
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Erlangen
- (wer)
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Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU)
- (wann)
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2012
- Beteiligte Personen und Organisationen
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Rumler, Maximilian
Rommel, Mathias
Erlekampf, Jürgen
Azizi, Maral
Geiger, Tobias
Bauer, Anton J.
Meißner, Elke
Frey, Lothar
- URN
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urn:nbn:de:bvb:29-opus-38398
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
25.03.2025, 13:44 MEZ
Datenpartner
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Beteiligte
- Rumler, Maximilian
- Rommel, Mathias
- Erlekampf, Jürgen
- Azizi, Maral
- Geiger, Tobias
- Bauer, Anton J.
- Meißner, Elke
- Frey, Lothar
- Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU)
Entstanden
- 2012
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Highly conductive grain boundaries in cold-sintered barium zirconate-based proton conductors
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