Aufsatzsammlung
Conductive atomic force microscopy : applications in nanomaterials
- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISBN
-
9783527340910
3527340912
- Dimensions
-
25 cm
- Extent
-
XIX, 361 Seiten
- Edition
-
[1. Auflage]
- Language
-
Englisch
- Notes
-
Illustrationen, Diagramme
- Keyword
-
Elektrische Leitfähigkeit
Rasterkraftmikroskopie
- Event
-
Veröffentlichung
- (where)
-
Weinheim, Germany
- (who)
-
Wiley-VCH
- (when)
-
[2017]
- Contributor
- Table of contents
- Rights
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Last update
-
11.03.2025, 12:26 PM CET
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Object type
- Aufsatzsammlung
Associated
- Lanza, Mario
- Wiley-VCH
- Wiley-VCH
Time of origin
- [2017]
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