Grain boundary segregation in multicrystalline silicon studied by correlative microscopy

Alternative title
Korngrenzensegregation in multikristallinem Silizium
Location
Deutsche Nationalbibliothek Frankfurt am Main
Extent
Online-Ressource
Language
Englisch
Notes
RWTH Aachen University, Dissertation, 2017

Classification
Physik
Keyword
Segregation
Microscopy
Grain
Silicon
Scanning transmission electron microscopy

Event
Veröffentlichung
(where)
Aachen
(who)
Universitätsbibliothek der RWTH Aachen
(when)
2017
Creator
Contributor
Raabe, Dierk
Mayer, Joachim

DOI
10.18154/RWTH-2017-06812
URN
urn:nbn:de:101:1-2018062607020942015917
Rights
Der Zugriff auf das Objekt ist unbeschränkt möglich.
Last update
25.03.2025, 1:41 PM CET

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Associated

Time of origin

  • 2017

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