Metal oxide-graphene field-effect transistor: interface trap density extraction model
- Standort
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Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
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Online-Ressource
- Erschienen in
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Metal oxide-graphene field-effect transistor: interface trap density extraction model ; volume:7 ; pages:1368-1376
Beilstein journal of nanotechnology ; 7, 1368-1376
- Klassifikation
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Ingenieurwissenschaften und Maschinenbau
- DOI
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10.3762/bjnano.7.128
- URN
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urn:nbn:de:101:1-201701181747
- Rechteinformation
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Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
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14.08.2025, 10:57 MESZ
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