- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISBN
-
9783527314942
3527314946
- Dimensions
-
25 cm
- Extent
-
XX, 303 S.
- Language
-
Englisch
- Notes
-
Ill., graph. Darst.
Literaturangaben
- Bibliographic citation
-
Advanced micro & nanosystems ; Vol. 6
- Classification
-
Elektrotechnik, Elektronik
- Keyword
-
MEMS
Zuverlässigkeit
- Event
-
Veröffentlichung
- (where)
-
Weinheim
- (who)
-
Wiley-VCH
- (when)
-
2008
- Contributor
-
Tabata, Osamu
- Table of contents
- Rights
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Last update
-
11.03.2025, 11:48 AM CET
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Tabata, Osamu
- Wiley-VCH
Time of origin
- 2008
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