- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISBN
-
9783527335015
3527335013
- Maße
-
24 cm
- Umfang
-
XX, 303 S.
- Sprache
-
Englisch
- Anmerkungen
-
Ill., graph. Darst.
Literaturangaben
- Klassifikation
-
Elektrotechnik, Elektronik
- Schlagwort
-
MEMS
Zuverlässigkeit
- Ereignis
-
Veröffentlichung
- (wo)
-
Weinheim
- (wer)
-
Wiley-VCH
- (wann)
-
2013
- Beteiligte Personen und Organisationen
-
Tabata, Osamu
Brand, Oliver
Fedder, Gary K.
Hierold, Christofer
Korvink, Jan G.
Tsuchiya, Toshiyuki
- Inhaltsverzeichnis
- Rechteinformation
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Letzte Aktualisierung
-
11.06.2025, 13:36 MESZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Beteiligte
- Tabata, Osamu
- Brand, Oliver
- Fedder, Gary K.
- Hierold, Christofer
- Korvink, Jan G.
- Tsuchiya, Toshiyuki
- Wiley-VCH
Entstanden
- 2013
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