Influence of active electrode impurity on memristive characteristics of ECM devices
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
-
Online-Ressource
- Sprache
-
Englisch
- Erschienen in
-
In: 10.1007/s10008-024-05821-w
- Klassifikation
-
Elektrotechnik, Elektronik
- Ereignis
-
Veröffentlichung
- (wo)
-
Aachen
- (wer)
-
Universitätsbibliothek der RWTH Aachen
- (wann)
-
2024
- Urheber
-
Michieletti, Fabio
Chen, Shaochuan
Schmidt-Weber, Carsten P.
Ricciardi, Carlo
Ohno, Takeo
Valov, Ilia
- DOI
-
10.18154/RWTH-2024-01710
- URN
-
urn:nbn:de:101:1-2024022400432335882142
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
25.03.2025, 13:50 MEZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
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Beteiligte
- Michieletti, Fabio
- Chen, Shaochuan
- Schmidt-Weber, Carsten P.
- Ricciardi, Carlo
- Ohno, Takeo
- Valov, Ilia
- Universitätsbibliothek der RWTH Aachen
Entstanden
- 2024
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