Research Activities of Nanodimensional Standards Using Atomic Force Microscopes, Transmission Electron Microscope, and Scanning Electron Microscope at the National Metrology Institute of Japan
- Standort
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Deutsche Nationalbibliothek Frankfurt am Main
- ISSN
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2520-8128
- Umfang
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Online-Ressource
- Sprache
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Englisch
- Anmerkungen
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online resource.
- Erschienen in
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Research Activities of Nanodimensional Standards Using Atomic Force Microscopes, Transmission Electron Microscope, and Scanning Electron Microscope at the National Metrology Institute of Japan ; day:4 ; month:11 ; year:2021 ; pages:1-8
Nanomanufacturing and metrology ; (4.11.2021), 1-8
- Urheber
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Misumi, Ichiko
Kizu, Ryosuke
Itoh, Hiroshi
Kumagai, Kazuhiro
Kobayashi, Keita
Sigehuzi, Tomoo
- Beteiligte Personen und Organisationen
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SpringerLink (Online service)
- DOI
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10.1007/s41871-021-00119-1
- URN
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urn:nbn:de:101:1-2022011819281259512920
- Rechteinformation
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Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
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15.08.2025, 07:25 MESZ
Datenpartner
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Beteiligte
- Misumi, Ichiko
- Kizu, Ryosuke
- Itoh, Hiroshi
- Kumagai, Kazuhiro
- Kobayashi, Keita
- Sigehuzi, Tomoo
- SpringerLink (Online service)
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