Research Activities of Nanodimensional Standards Using Atomic Force Microscopes, Transmission Electron Microscope, and Scanning Electron Microscope at the National Metrology Institute of Japan

Location
Deutsche Nationalbibliothek Frankfurt am Main
ISSN
2520-8128
Extent
Online-Ressource
Language
Englisch
Notes
online resource.

Bibliographic citation
Research Activities of Nanodimensional Standards Using Atomic Force Microscopes, Transmission Electron Microscope, and Scanning Electron Microscope at the National Metrology Institute of Japan ; day:4 ; month:11 ; year:2021 ; pages:1-8
Nanomanufacturing and metrology ; (4.11.2021), 1-8

Creator
Misumi, Ichiko
Kizu, Ryosuke
Itoh, Hiroshi
Kumagai, Kazuhiro
Kobayashi, Keita
Sigehuzi, Tomoo
Contributor
SpringerLink (Online service)

DOI
10.1007/s41871-021-00119-1
URN
urn:nbn:de:101:1-2022011819281259512920
Rights
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
Last update
15.08.2025, 7:25 AM CEST

Data provider

This object is provided by:
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Associated

  • Misumi, Ichiko
  • Kizu, Ryosuke
  • Itoh, Hiroshi
  • Kumagai, Kazuhiro
  • Kobayashi, Keita
  • Sigehuzi, Tomoo
  • SpringerLink (Online service)

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