Research Activities of Nanodimensional Standards Using Atomic Force Microscopes, Transmission Electron Microscope, and Scanning Electron Microscope at the National Metrology Institute of Japan
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- ISSN
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2520-8128
- Extent
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Online-Ressource
- Language
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Englisch
- Notes
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online resource.
- Bibliographic citation
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Research Activities of Nanodimensional Standards Using Atomic Force Microscopes, Transmission Electron Microscope, and Scanning Electron Microscope at the National Metrology Institute of Japan ; day:4 ; month:11 ; year:2021 ; pages:1-8
Nanomanufacturing and metrology ; (4.11.2021), 1-8
- Creator
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Misumi, Ichiko
Kizu, Ryosuke
Itoh, Hiroshi
Kumagai, Kazuhiro
Kobayashi, Keita
Sigehuzi, Tomoo
- Contributor
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SpringerLink (Online service)
- DOI
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10.1007/s41871-021-00119-1
- URN
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urn:nbn:de:101:1-2022011819281259512920
- Rights
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Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
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15.08.2025, 7:25 AM CEST
Data provider
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Misumi, Ichiko
- Kizu, Ryosuke
- Itoh, Hiroshi
- Kumagai, Kazuhiro
- Kobayashi, Keita
- Sigehuzi, Tomoo
- SpringerLink (Online service)