- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
-
Online-Ressource
- Sprache
-
Englisch
- Anmerkungen
-
In: Fault tolerant computing : digest of papers. Los Alamitos, Calif. : IEEE Computer Soc. Pr. - ISBN 0-8186-2051-X, S. 390-397. URL http://dx.doi.org./10.1109/FTCS.1990.89393
- Klassifikation
-
Elektrotechnik, Elektronik
- Schlagwort
-
Selbsttest ; VLSI ; Integrierte Schaltung
- Ereignis
-
Veröffentlichung
- (wo)
-
Stuttgart
- (wer)
-
Universitätsbibliothek der Universität Stuttgart
- (wann)
-
2012
- Urheber
- URN
-
urn:nbn:de:bsz:93-opus-73199
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
25.03.2025, 13:55 MEZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Beteiligte
- Eschermann, Bernhard
- Wunderlich, Hans-Joachim
- Universitätsbibliothek der Universität Stuttgart
Entstanden
- 2012
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