Characterizing the electrical properties of raised S/D junctionless thin-film transistors with a dual-gate structure

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Location: Deutsche Nationalbibliothek Frankfurt am Main

ISSN: 1556-276X

Extent: Online-Ressource

Language: Englisch

Notes: online resource.

Bibliographic citation: Characterizing the electrical properties of raised S/D junctionless thin-film transistors with a dual-gate structure ; volume:9 ; number:1 ; day:11 ; month:12 ; year:2014 ; pages:1-7 ; date:12.2014
Nanoscale research letters ; 9, Heft 1 (11.12.2014), 1-7, 12.2014

Classification: Elektrotechnik, Elektronik

Creator: Cheng, Ya-Chi
Chen, Hung-Bin
Su, Jun-Ji
Shao, Chi-Shen
Wang, Cheng-Ping
Chang, Chun-Yen
Wu, Yung-Chun

Contributor: SpringerLink (Online service)

DOI: 10.1186/1556-276X-9-669

URN: urn:nbn:de:101:1-2021082622371084966999

Rights: Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.

Last update: 14.08.2025, 10:59 AM CEST

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Cheng, Ya-Chi
Chen, Hung-Bin
Su, Jun-Ji
Shao, Chi-Shen
Wang, Cheng-Ping
Chang, Chun-Yen
Wu, Yung-Chun
SpringerLink (Online service)

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Characterizing the electrical properties of raised S/D junctionless thin-film transistors with a dual-gate structure

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