Toward surface defect detection in electronics manufacturing by an accurate and lightweight YOLO-style object detector
- Location
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                Deutsche Nationalbibliothek Frankfurt am Main
 
- Extent
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                Online-Ressource, 1 online resource.
 
- Language
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                Englisch
 
- Bibliographic citation
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                Toward surface defect detection in electronics manufacturing by an accurate and lightweight YOLO-style object detector ; volume:13 ; number:1 ; day:1 ; month:5 ; year:2023 ; pages:1-12 ; date:12.2023
Scientific reports ; 13, Heft 1 (1.5.2023), 1-12, 12.2023
 
- Creator
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                Wang, Jyunrong
Dai, Huafeng
Chen, Taogen
Liu, Hao
Zhang, Xuegang
Zhong, Quan
Lu, Rongsheng
 
- Contributor
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                SpringerLink (Online service)
 
- DOI
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                        10.1038/s41598-023-33804-w
 
- URN
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                        urn:nbn:de:101:1-2023090511051352501034
 
- Rights
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                        Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
 
- Last update
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                        14.08.2025, 11:02 AM CEST
 
Data provider
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Wang, Jyunrong
 - Dai, Huafeng
 - Chen, Taogen
 - Liu, Hao
 - Zhang, Xuegang
 - Zhong, Quan
 - Lu, Rongsheng
 - SpringerLink (Online service)