Toward surface defect detection in electronics manufacturing by an accurate and lightweight YOLO-style object detector

Location
Deutsche Nationalbibliothek Frankfurt am Main
Extent
Online-Ressource, 1 online resource.
Language
Englisch

Bibliographic citation
Toward surface defect detection in electronics manufacturing by an accurate and lightweight YOLO-style object detector ; volume:13 ; number:1 ; day:1 ; month:5 ; year:2023 ; pages:1-12 ; date:12.2023
Scientific reports ; 13, Heft 1 (1.5.2023), 1-12, 12.2023

Creator
Wang, Jyunrong
Dai, Huafeng
Chen, Taogen
Liu, Hao
Zhang, Xuegang
Zhong, Quan
Lu, Rongsheng
Contributor
SpringerLink (Online service)

DOI
10.1038/s41598-023-33804-w
URN
urn:nbn:de:101:1-2023090511051352501034
Rights
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
Last update
14.08.2025, 11:02 AM CEST

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Associated

  • Wang, Jyunrong
  • Dai, Huafeng
  • Chen, Taogen
  • Liu, Hao
  • Zhang, Xuegang
  • Zhong, Quan
  • Lu, Rongsheng
  • SpringerLink (Online service)

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