Toward surface defect detection in electronics manufacturing by an accurate and lightweight YOLO-style object detector
- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- Extent
-
Online-Ressource, 1 online resource.
- Language
-
Englisch
- Bibliographic citation
-
Toward surface defect detection in electronics manufacturing by an accurate and lightweight YOLO-style object detector ; volume:13 ; number:1 ; day:1 ; month:5 ; year:2023 ; pages:1-12 ; date:12.2023
Scientific reports ; 13, Heft 1 (1.5.2023), 1-12, 12.2023
- Creator
-
Wang, Jyunrong
Dai, Huafeng
Chen, Taogen
Liu, Hao
Zhang, Xuegang
Zhong, Quan
Lu, Rongsheng
- Contributor
-
SpringerLink (Online service)
- DOI
-
10.1038/s41598-023-33804-w
- URN
-
urn:nbn:de:101:1-2023090511051352501034
- Rights
-
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
14.08.2025, 11:02 AM CEST
Data provider
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Wang, Jyunrong
- Dai, Huafeng
- Chen, Taogen
- Liu, Hao
- Zhang, Xuegang
- Zhong, Quan
- Lu, Rongsheng
- SpringerLink (Online service)