Effects of top electrode material in hafnium-oxide-based memristive systems on highly-doped Si
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- ISSN
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2045-2322
- Extent
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Online-Ressource
- Language
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Englisch
- Notes
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online resource.
- Bibliographic citation
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Effects of top electrode material in hafnium-oxide-based memristive systems on highly-doped Si ; volume:10 ; number:1 ; day:11 ; month:11 ; year:2020 ; pages:1-8 ; date:12.2020
Scientific reports ; 10, Heft 1 (11.11.2020), 1-8, 12.2020
- Creator
- Contributor
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SpringerLink (Online service)
- DOI
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10.1038/s41598-020-76333-6
- URN
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urn:nbn:de:101:1-2020121818315301134756
- Rights
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Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
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15.08.2025, 7:38 AM CEST
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Saylan, Sueda
- Aldosari, Haila M.
- Humood, Khaled
- Abi Jaoude, Maguy
- Ravaux, Florent
- Mohammad, Baker
- SpringerLink (Online service)
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