- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISSN
-
1573-0727
- Extent
-
Online-Ressource
- Language
-
Englisch
- Notes
-
online resource.
- Bibliographic citation
-
Bandwidth Analysis of Functional Interconnects Used as Test Access Mechanism ; volume:26 ; number:4 ; day:10 ; month:7 ; year:2010 ; pages:453-464 ; date:8.2010
Journal of electronic testing ; 26, Heft 4 (10.7.2010), 453-464, 8.2010
- Classification
-
Elektrotechnik, Elektronik
- Creator
-
Berg, Ardy van den
Ren, Pengwei
Marinissen, Erik Jan
Gaydadjiev, Georgi
Goossens, Kees
- Contributor
-
SpringerLink (Online service)
- DOI
-
10.1007/s10836-010-5163-x
- URN
-
urn:nbn:de:101:1-2019110205265426573456
- Rights
-
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
15.08.2025, 7:33 AM CEST
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Associated
- Berg, Ardy van den
- Ren, Pengwei
- Marinissen, Erik Jan
- Gaydadjiev, Georgi
- Goossens, Kees
- SpringerLink (Online service)
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