Bandwidth Analysis of Functional Interconnects Used as Test Access Mechanism
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISSN
-
1573-0727
- Umfang
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Online-Ressource
- Sprache
-
Englisch
- Anmerkungen
-
online resource.
- Erschienen in
-
Bandwidth Analysis of Functional Interconnects Used as Test Access Mechanism ; volume:26 ; number:4 ; day:10 ; month:7 ; year:2010 ; pages:453-464 ; date:8.2010
Journal of electronic testing ; 26, Heft 4 (10.7.2010), 453-464, 8.2010
- Klassifikation
-
Elektrotechnik, Elektronik
- Urheber
-
Berg, Ardy van den
Ren, Pengwei
Marinissen, Erik Jan
Gaydadjiev, Georgi
Goossens, Kees
- Beteiligte Personen und Organisationen
-
SpringerLink (Online service)
- DOI
-
10.1007/s10836-010-5163-x
- URN
-
urn:nbn:de:101:1-2019110205265426573456
- Rechteinformation
-
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
15.08.2025, 07:33 MESZ
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Beteiligte
- Berg, Ardy van den
- Ren, Pengwei
- Marinissen, Erik Jan
- Gaydadjiev, Georgi
- Goossens, Kees
- SpringerLink (Online service)
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