Secure testing of VLSI cryptographic equipment

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Location: Deutsche Nationalbibliothek Frankfurt am Main

ISBN: 9783891916889
3891916884

Dimensions: 21 cm

Extent: XV, 123 S.

Edition: 1. Aufl.

Language: Englisch

Notes: Ill., graph. Darst
Literaturverz. S. 107 - 112
Zugl.: Zürich, Eidgenössische Techn. Hochsch., Diss., 1993

Bibliographic citation: Series in microelectronics ; Vol. 25

Keyword: VLSI
Blockchiffre
Selbsttest

Event: Veröffentlichung

(where): Konstanz

(who): Hartung-Gorre

(when): 1993

Creator: Bonnenberg, Heinz

Table of contents: https://d-nb.info/931232643/04

Rights: Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.

Last update: 11.06.2025, 2:21 PM CEST

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Bonnenberg, Heinz
Hartung-Gorre

Time of origin

1993

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Secure testing of VLSI cryptographic equipment

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Other Objects (12)

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Globally asynchronous locally synchronous architectures for VLSI systems

Low-power techniques for low-frequency VLSI applications

VLSI architectures for computations in finite rings and fields

VLSI architectures for compressive sensing and sparse signal recovery

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Approaches to efficient and robust cryptographic protocols

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Low-power techniques for low-frequency VLSI applications

VLSI architectures for computations in finite rings and fields

VLSI architectures for compressive sensing and sparse signal recovery

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VLSI circuits for MIMO preprocessing

Approaches to efficient and robust cryptographic protocols

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