- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
-
Online-Ressource
- Sprache
-
Englisch
- Erschienen in
-
Defect Profiling of Oxide‐Semiconductor Interfaces Using Low‐Energy Muons ; day:23 ; month:06 ; year:2023 ; extent:10
Advanced materials interfaces ; (23.06.2023) (gesamt 10)
- Urheber
- DOI
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10.1002/admi.202300209
- URN
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urn:nbn:de:101:1-2023062415022986134571
- Rechteinformation
-
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
14.08.2025, 11:01 MESZ
Datenpartner
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Beteiligte
- Mendes Martins, Maria
- Kumar, Piyush
- Wörle, Judith
- Ni, Xiaojie
- Grossner, Ulrike
- Prokscha, Thomas
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