Defect Profiling of Oxide‐Semiconductor Interfaces Using Low‐Energy Muons

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Location: Deutsche Nationalbibliothek Frankfurt am Main

Extent: Online-Ressource

Language: Englisch

Bibliographic citation: Defect Profiling of Oxide‐Semiconductor Interfaces Using Low‐Energy Muons ; day:23 ; month:06 ; year:2023 ; extent:10
Advanced materials interfaces ; (23.06.2023) (gesamt 10)

Creator: Mendes Martins, Maria
Kumar, Piyush
Wörle, Judith
Ni, Xiaojie
Grossner, Ulrike
Prokscha, Thomas

DOI: 10.1002/admi.202300209

URN: urn:nbn:de:101:1-2023062415022986134571

Rights: Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.

Last update: 14.08.2025, 11:01 AM CEST

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Mendes Martins, Maria
Kumar, Piyush
Wörle, Judith
Ni, Xiaojie
Grossner, Ulrike
Prokscha, Thomas

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Defect Profiling of Oxide‐Semiconductor Interfaces Using Low‐Energy Muons

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Other Objects (12)

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