Electromigration failure by shape change of voids in bamboo lines

Digitalisierung: Bayerische Staatsbibliothek

In copyright

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Location
München, Bayerische Staatsbibliothek -- 4 Z 53.18-76,3/4#S.1563-1571
Extent
1 Online-Ressource (S. 1563 - 1571)
Language
Englisch
Notes
Ill., graph. Darst.
In: Journal of applied physics, Vol. 104, No. 17, 1996. - Woodbury, NY : American Inst. of Physics

Event
Veröffentlichung
(where)
Woodbury, NY
(who)
American Inst. of Physics
(when)
1994
Contributor

URN
urn:nbn:de:bvb:12-bsb00086573-2
Last update
16.04.2025, 8:48 AM CEST

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Associated

Time of origin

  • 1994

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