Monografie

Electromigration failure by shape change of voids in bamboo lines

Digitalisat: Bayerische Staatsbibliothek

Free access - no reuse

0
/
0

Language
Englisch
Notes
In: Journal of applied physics, Vol. 104, No. 17, 1996. - Woodbury, NY : American Inst. of Physics
Location
München, Bayerische Staatsbibliothek -- 4 Z 53.18-76,3/4#S.1563-1571

Contributor
Published
Woodbury, NY : American Inst. of Physics, 1994

URN
urn:nbn:de:bvb:12-bsb00086573-2
Last update
16.04.2024, 1:55 PM CEST

Associated


Time of origin


  • Woodbury, NY : American Inst. of Physics, 1994

Other Objects (12)