Nanoscale characterisation of ferroelectric materials : scanning probe microscopy approach
This book is a basic introduction to the field of nanoscale measurements of ferroelectric materials using scanning probe microscopy. It addresses imaging mechanisms and quantitative analysis in piezoelectric scanning probe microscopy, as well as basic physics at the nanoscale level in ferroelectrics, including nanoscale switching, scaling effects, and transport mechanisms. It will be a useful reference both for specialists and for newcomers or graduate students. TOC:Introduction.- Scanning Probe Microscopy of Ferroelectrics: Experimental Methods.- Imaging Mechanism and Quantification of Scanning Force Microscopy of Ferroelectric Surfaces.- Nanoscale Switching in Ferroelectric Thin Films: Domain Dynamics and Degradation Effects.- Quantitative Analysis of the Piezoelectric Response.- Scaling Effect and Domain Relaxation in Ferroelectric Thin Films.- Scanning Nonlinear Dielectric Microscopy.- Scanning Tunneling Microscopy of Ferroelectrics.- Nanoscale Transport in Ferroelectric Thin Films and Mesoscopic Structures.- SNOM Imaging of Ferroelectric Domains.- Phase Transitions in Ferroelectrics by SPM.- SPM-Based High-Density Ferroelectric Storage Devices
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISBN
-
9783540206620
3540206620
- Maße
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24 cm
- Umfang
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XIII, 282 S.
- Sprache
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Englisch
- Anmerkungen
-
Ill., graph. Darst.
Literaturangaben
- Klassifikation
-
Ingenieurwissenschaften und Maschinenbau
- Schlagwort
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Nanostrukturiertes Material
Ferroelektrikum
Rastersondenmikroskopie
- Ereignis
-
Veröffentlichung
- (wo)
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Berlin, Heidelberg, New York, Hong Kong, London, Milan, Paris, Tokyo
- (wer)
-
Springer
- (wann)
-
2004
- Beteiligte Personen und Organisationen
- Inhaltsverzeichnis
- Rechteinformation
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Letzte Aktualisierung
-
11.03.2025, 11:37 MEZ
Datenpartner
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Beteiligte
- Alexe, Marin
- Springer
Entstanden
- 2004
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