Scanning tunneling microscopy of buried dopants in silicon: images and their uncertainties
- Standort
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Deutsche Nationalbibliothek Frankfurt am Main
- ISSN
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2057-3960
- Umfang
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Online-Ressource
- Sprache
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Englisch
- Anmerkungen
-
online resource.
- Erschienen in
-
Scanning tunneling microscopy of buried dopants in silicon: images and their uncertainties ; volume:8 ; number:1 ; day:23 ; month:8 ; year:2022 ; pages:1-9 ; date:12.2022
npj computational materials ; 8, Heft 1 (23.8.2022), 1-9, 12.2022
- Urheber
-
Różański, Piotr T.
Bryant, Garnett W.
Zieliński, Michał
- Beteiligte Personen und Organisationen
-
SpringerLink (Online service)
- DOI
-
10.1038/s41524-022-00857-w
- URN
-
urn:nbn:de:101:1-2022111121223215366684
- Rechteinformation
-
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
16.03.20252025, 10:20 MEZ
Datenpartner
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Beteiligte
- Różański, Piotr T.
- Bryant, Garnett W.
- Zieliński, Michał
- SpringerLink (Online service)
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