- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
-
Online-Ressource
- Sprache
-
Englisch
- Anmerkungen
-
In: Meeting the tests of time : International Test Conference 1989. Washington, DC : IEEE Computer Soc. Pr., 1989. - ISBN 0-8186-8962-5, S. 19-27. URL http://dx.doi.org./ 10.1109/TEST.1989.82273
- Klassifikation
-
Elektrotechnik, Elektronik
- Schlagwort
-
Testbarkeit ; Flip-Flop ; Fehlermodell
- Ereignis
-
Veröffentlichung
- (wo)
-
Stuttgart
- (wer)
-
Universitätsbibliothek der Universität Stuttgart
- (wann)
-
2012
- Urheber
- URN
-
urn:nbn:de:bsz:93-opus-73342
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
25.03.2025, 13:48 MEZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Beteiligte
- Wunderlich, Hans-Joachim
- Hellebrand, Sybille
- Universitätsbibliothek der Universität Stuttgart
Entstanden
- 2012
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