Submicron contacts for electrical characterization of semiconducting WS2 thin films
- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- Extent
-
Online-Ressource
- Language
-
Englisch
- Bibliographic citation
-
In: Journal of Vacuum Science and Technology / A, Vacuum, Surfaces, and Films ; 16 (1998), 3. - S. 1239-1243
- Classification
-
Physik
- Event
-
Veröffentlichung
- (where)
-
Konstanz
- (who)
-
Bibliothek der Universität Konstanz
- (when)
-
2007
- Creator
-
Ballif, Christophe
Regula, Manfred
Lévy, Francis
Burmeister, Frank
Schäfle, Claudia
Matthes, Thomas
Leiderer, Paul
Niedermann, Philippe
Gutmannsbauer, W.
Bucher, Ron
- URN
-
urn:nbn:de:bsz:352-opus-28915
- Rights
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
25.03.2025, 1:51 PM CET
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Ballif, Christophe
- Regula, Manfred
- Lévy, Francis
- Burmeister, Frank
- Schäfle, Claudia
- Matthes, Thomas
- Leiderer, Paul
- Niedermann, Philippe
- Gutmannsbauer, W.
- Bucher, Ron
- Bibliothek der Universität Konstanz
Time of origin
- 2007
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Electrons at helium interfaces
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Ions at helium interfaces
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