Numerical modelling of electrostatic force microscopes considering charge and dielectric constant
- Standort
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Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
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Online-Ressource
- Sprache
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Englisch
- Erschienen in
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In: Bala, U.B.; Greiff, M.; Preisner, T.; Mathis, W.: Numerical modelling of electrostatic force microscopes considering charge and dielectric constant. In: COMPEL - The International Journal for Computation and Mathematics in Electrical and Electronic Engineering 28 (2009), Nr. 1, S. 109-119. DOI: https://doi.org/10.1108/03321640910918913
- Ereignis
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Veröffentlichung
- (wo)
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Hannover, Hannover
- (wer)
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Gottfried Wilhelm Leibniz Universität Hannover, Technische Informationsbibliothek (TIB)
- (wann)
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2009
- DOI
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10.15488/2743
- URN
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urn:nbn:de:101:1-2020062307055967240051
- Rechteinformation
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Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
25.03.2025, 13:43 MEZ
Datenpartner
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Beteiligte
- Gottfried Wilhelm Leibniz Universität Hannover, Technische Informationsbibliothek (TIB)
Entstanden
- 2009
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