Numerical modelling of electrostatic force microscopes considering charge and dielectric constant
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Extent
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Online-Ressource
- Language
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Englisch
- Bibliographic citation
-
In: Bala, U.B.; Greiff, M.; Preisner, T.; Mathis, W.: Numerical modelling of electrostatic force microscopes considering charge and dielectric constant. In: COMPEL - The International Journal for Computation and Mathematics in Electrical and Electronic Engineering 28 (2009), Nr. 1, S. 109-119. DOI: https://doi.org/10.1108/03321640910918913
- Event
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Veröffentlichung
- (where)
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Hannover, Hannover
- (who)
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Gottfried Wilhelm Leibniz Universität Hannover, Technische Informationsbibliothek (TIB)
- (when)
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2009
- DOI
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10.15488/2743
- URN
-
urn:nbn:de:101:1-2020062307055967240051
- Rights
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
25.03.2025, 1:43 PM CET
Data provider
This object is provided by:
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Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Gottfried Wilhelm Leibniz Universität Hannover, Technische Informationsbibliothek (TIB)
Time of origin
- 2009
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