- Standort
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Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
-
Online-Ressource
- Erschienen in
-
Customized MFM probes with high lateral resolution ; volume:7 ; pages:1068-1074
Beilstein journal of nanotechnology ; 7, 1068-1074
- Klassifikation
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Ingenieurwissenschaften und Maschinenbau
- DOI
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10.3762/bjnano.7.100
- URN
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urn:nbn:de:101:1-201701173582
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
14.08.2025, 11:02 MESZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
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