- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Extent
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Online-Ressource
- Bibliographic citation
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Customized MFM probes with high lateral resolution ; volume:7 ; pages:1068-1074
Beilstein journal of nanotechnology ; 7, 1068-1074
- Classification
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Ingenieurwissenschaften und Maschinenbau
- DOI
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10.3762/bjnano.7.100
- URN
-
urn:nbn:de:101:1-201701173582
- Rights
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Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
14.08.2025, 11:02 AM CEST
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
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