- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- Extent
-
Online-Ressource
- Language
-
Englisch
- Notes
-
In: Materials reliability in microelectronics II : symposium held April 27 - May 1, 1992, San Francisco, California, U.S.A. / ed.: C. V. Thompson ... - Pittsburgh, Pa. : Materials Research Society, 1992. - (Materials Research Society symposium proceedings ; 265), S. 45-50
- Classification
-
Ingenieurwissenschaften und Maschinenbau
- Keyword
-
Beanspruchung ; Modell ; Konduktor
- Event
-
Veröffentlichung
- (where)
-
Saarbrücken
- (who)
-
Saarländische Universitäts- und Landesbibliothek
- (when)
-
2008
- Creator
- URN
-
urn:nbn:de:bsz:291-scidok-17869
- Rights
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
14.08.2025, 10:49 AM CEST
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Lloyd, J. R.
- Arzt, Eduard
- Saarländische Universitäts- und Landesbibliothek
Time of origin
- 2008
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Electromigration failure by shape change of voids in bamboo lines
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