Simultaneous large-scale reliability analysis of ultra-thin MOS gate dielectrics using an automated test system
- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- Extent
-
Online-Ressource
- Language
-
Englisch
- Bibliographic citation
-
In: Advances in Radio Science (6): 205-207 (2008)
- Classification
-
Elektrotechnik, Elektronik
- Event
-
Veröffentlichung
- (where)
-
Hamburg
- (who)
-
Universitätsbibliothek der Technischen Universität Hamburg-Harburg
- (when)
-
2008
- URN
-
urn:nbn:de:gbv:830-882.043858
- Rights
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
25.03.2025, 1:46 PM CET
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Domdey, Andreas
- Hafkemeyer, Kristian M.
- Krautschneider, Wolfgang
- Schröder, Dietmar
- Universitätsbibliothek der Technischen Universität Hamburg-Harburg
Time of origin
- 2008
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