X-ray imaging of silicon die within fully packaged semiconductor devices

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Location: Deutsche Nationalbibliothek Frankfurt am Main

Extent: Online-Ressource

Language: Englisch

Notes: Powder diffraction. - 36, 2 (2021) , 78 - 84, ISSN: 1945-7413

Event: Veröffentlichung

(where): Freiburg

(who): Universität

(when): 2021

Creator: Tanner, Brian K.
McNally, Patrick
Danilewsky, Andreas N.

DOI: 10.1017/S088571562100021X

URN: urn:nbn:de:bsz:25-freidok-1944664

Rights: Kein Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.

Last update: 15.08.2025, 7:30 AM CEST

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2021

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X-ray imaging of silicon die within fully packaged semiconductor devices

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Associated

Time of origin

Other Objects (12)

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