Brian K. Tanner
Physiker
Geboren:
1947
Creative Commons Attribution 3.0
Werke:
- X-ray diffraction topography
- X-ray imaging of silicon die within fully packaged semiconductor devices
- X-ray diffraction imaging of fully packaged n–p–n transistors under accelerated ageing conditions
- Quantitative imaging of the stress/strain fields and generation of macroscopic cracks from indents in silicon