Kelvin probe force microscopy of the nanoscale electrical surface potential barrier of metal/semiconductor interfaces in ambient atmosphere

Location
Deutsche Nationalbibliothek Frankfurt am Main
Extent
Online-Ressource
Language
Englisch

Bibliographic citation
Kelvin probe force microscopy of the nanoscale electrical surface potential barrier of metal/semiconductor interfaces in ambient atmosphere ; volume:10 ; pages:1401-1411
Beilstein journal of nanotechnology ; 10, 1401-1411

Classification
Ingenieurwissenschaften und Maschinenbau

DOI
10.3762/bjnano.10.138
URN
urn:nbn:de:101:1-2020111912172334019542
Rights
Der Zugriff auf das Objekt ist unbeschränkt möglich.
Last update
15.08.2025, 7:25 AM CEST

Data provider

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