Hochschulschrift
Modelling methods for testability analysis of analog integrated circuits based on pole-zero analysis
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- Maße
-
30 cm
- Umfang
-
IV, 175 S.
- Sprache
-
Englisch
- Anmerkungen
-
graph. Darst.
Duisburg, Essen, Univ., Diss., 2004 (Nicht für den Austausch)
- Klassifikation
-
Ingenieurwissenschaften und Maschinenbau
- Schlagwort
-
Analogschaltung
Testbarkeit
Beobachtbarkeit
Steuerbarkeit
Sensitivitätsanalyse
- Urheber
- Inhaltsverzeichnis
- Rechteinformation
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Letzte Aktualisierung
-
11.03.2025, 12:00 MEZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
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Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Objekttyp
- Hochschulschrift
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