Hochschulschrift | Online-Publikation
Modelling methods for testability analysis of analog integrated circuits based on pole-zero analysis
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
-
Online-Ressource
- Sprache
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Englisch
- Anmerkungen
-
Duisburg, Essen, Univ., Diss., 2004
- Klassifikation
-
Ingenieurwissenschaften und Maschinenbau
- Schlagwort
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Analogschaltung
Testbarkeit
Beobachtbarkeit
Steuerbarkeit
Sensitivitätsanalyse
- Urheber
- URN
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urn:nbn:de:hbz:464-duett-09082004-1138053
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
25.03.2025, 13:42 MEZ
Datenpartner
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Objekttyp
- Hochschulschrift
- Online-Publikation
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