Impact of the Ohmic Electrode on the Endurance of Oxide-Based Resistive Switching Memory
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
-
Online-Ressource
- Sprache
-
Englisch
- Erschienen in
-
In: 10.1109/TED.2021.3049765
- Ereignis
-
Veröffentlichung
- (wo)
-
Aachen
- (wer)
-
Universitätsbibliothek der RWTH Aachen
- (wann)
-
2021
- Urheber
-
Wiefels, Stefan
Witzleben, Moritz Alexander von
Huttemann, Michael
Böttger, Ulrich
Waser, Rainer
Menzel, Stephan
- DOI
-
10.18154/RWTH-2021-02225
- URN
-
urn:nbn:de:101:1-2021031002303013933063
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
15.08.2025, 07:25 MESZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
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Beteiligte
- Wiefels, Stefan
- Witzleben, Moritz Alexander von
- Huttemann, Michael
- Böttger, Ulrich
- Waser, Rainer
- Menzel, Stephan
- Universitätsbibliothek der RWTH Aachen
Entstanden
- 2021
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