Impact of the Ohmic Electrode on the Endurance of Oxide-Based Resistive Switching Memory
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Extent
-
Online-Ressource
- Language
-
Englisch
- Bibliographic citation
-
In: 10.1109/TED.2021.3049765
- Event
-
Veröffentlichung
- (where)
-
Aachen
- (who)
-
Universitätsbibliothek der RWTH Aachen
- (when)
-
2021
- Creator
-
Wiefels, Stefan
von Witzleben, Moritz Alexander
Huttemann, Michael
Böttger, Ulrich
Waser, Rainer
Menzel, Stephan
- DOI
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10.18154/RWTH-2021-02225
- URN
-
urn:nbn:de:101:1-2021031002303013933063
- Rights
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
25.03.2025, 1:55 PM CET
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Wiefels, Stefan
- von Witzleben, Moritz Alexander
- Huttemann, Michael
- Böttger, Ulrich
- Waser, Rainer
- Menzel, Stephan
- Universitätsbibliothek der RWTH Aachen
Time of origin
- 2021
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