Trap‐Assisted Memristive Switching in HfO 2 ‐Based Devices Studied by In Situ Soft and Hard X‐Ray Photoelectron Spectroscopy

Location
Deutsche Nationalbibliothek Frankfurt am Main
Extent
Online-Ressource
Language
Englisch

Bibliographic citation
Trap‐Assisted Memristive Switching in HfO 2 ‐Based Devices Studied by In Situ Soft and Hard X‐Ray Photoelectron Spectroscopy ; day:24 ; month:04 ; year:2023 ; extent:17
Advanced electronic materials ; (24.04.2023) (gesamt 17)

Creator
Zahari, Finn
Marquardt, Richard
Kalläne, Matthias
Gronenberg, Ole
Schlueter, Christoph
Matveyev, Yury
Haberfehlner, Georg
Diekmann, Florian
Nierhauve, Alena
Buck, Jens
Hanff, Arndt
Kolhatkar, Gitanjali
Kothleitner, Gerald
Kienle, Lorenz
Ziegler, Martin
Carstensen, Jürgen
Rossnagel, Kai
Kohlstedt, Hermann

DOI
10.1002/aelm.202201226
URN
urn:nbn:de:101:1-2023042515245933284593
Rights
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
Last update
14.08.2025, 10:48 AM CEST

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Associated

  • Zahari, Finn
  • Marquardt, Richard
  • Kalläne, Matthias
  • Gronenberg, Ole
  • Schlueter, Christoph
  • Matveyev, Yury
  • Haberfehlner, Georg
  • Diekmann, Florian
  • Nierhauve, Alena
  • Buck, Jens
  • Hanff, Arndt
  • Kolhatkar, Gitanjali
  • Kothleitner, Gerald
  • Kienle, Lorenz
  • Ziegler, Martin
  • Carstensen, Jürgen
  • Rossnagel, Kai
  • Kohlstedt, Hermann

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