Capacitance voltage curve simulations for different passivation parameters of dielectric layers on silicon
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
-
Online-Ressource
- Sprache
-
Englisch
- Erschienen in
-
In: Journal of physics(1433, 2020)
- Ereignis
-
Veröffentlichung
- (wo)
-
Ilmenau
- (wer)
-
TU Ilmenau
- (wann)
-
2020
- Urheber
-
Sevillano-Bendezú, Miguel Ángel
Dulanto, Jorge A.
Conde, L.A.
Grieseler, Rolf
Guerra, Jorge A.
Töfflinger, Jan Amaru
- DOI
-
10.1088/1742-6596/1433/1/012007
- URN
-
urn:nbn:de:101:1-2020070603072327793636
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
25.03.2025, 13:41 MEZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Beteiligte
- Sevillano-Bendezú, Miguel Ángel
- Dulanto, Jorge A.
- Conde, L.A.
- Grieseler, Rolf
- Guerra, Jorge A.
- Töfflinger, Jan Amaru
- TU Ilmenau
Entstanden
- 2020
Ähnliche Objekte (12)
Capacitance-voltage spectroscopy and analysis of dielectric intrinsic amorphous silicon thin films
Surface passivation study on gettered multicrystalline silicon
Surface passivation of crystalline silicon solar cells by amorphous silicon films
Instability of Dielectric Surface Passivation Quality at Elevated Temperature and Illumination
Advances in the surface passivation of silicon solar cells
Al2O3 rear surface passivation for silicon ribbon solar cells
Silicon interface passivation studied by modulated surface photovoltage spectroscopy
Crystalline silicon solar cells : advanced surface passivation and analysis
Dielectric rear side passivation on Ribbon Growth on Substrate (RGS) solar cells
On the stability of dielectric passivation layers under illumination and temperature treatment
Electronic characteristics of ultra‐thin passivation layers for silicon photovoltaics
Rapid thermal processing of silicon solar cells : passivation and diffusion
Capacitance-voltage spectroscopy and analysis of dielectric intrinsic amorphous silicon thin films
Surface passivation study on gettered multicrystalline silicon
Surface passivation of crystalline silicon solar cells by amorphous silicon films
Instability of Dielectric Surface Passivation Quality at Elevated Temperature and Illumination
Advances in the surface passivation of silicon solar cells
Al2O3 rear surface passivation for silicon ribbon solar cells
Silicon interface passivation studied by modulated surface photovoltage spectroscopy
Crystalline silicon solar cells : advanced surface passivation and analysis
Dielectric rear side passivation on Ribbon Growth on Substrate (RGS) solar cells
On the stability of dielectric passivation layers under illumination and temperature treatment
Electronic characteristics of ultra‐thin passivation layers for silicon photovoltaics
Rapid thermal processing of silicon solar cells : passivation and diffusion
Capacitance-voltage spectroscopy and analysis of dielectric intrinsic amorphous silicon thin films
Surface passivation study on gettered multicrystalline silicon
Surface passivation of crystalline silicon solar cells by amorphous silicon films
Instability of Dielectric Surface Passivation Quality at Elevated Temperature and Illumination
Advances in the surface passivation of silicon solar cells
Al2O3 rear surface passivation for silicon ribbon solar cells
Silicon interface passivation studied by modulated surface photovoltage spectroscopy
Crystalline silicon solar cells : advanced surface passivation and analysis
Dielectric rear side passivation on Ribbon Growth on Substrate (RGS) solar cells
On the stability of dielectric passivation layers under illumination and temperature treatment
Electronic characteristics of ultra‐thin passivation layers for silicon photovoltaics