Capacitance voltage curve simulations for different passivation parameters of dielectric layers on silicon
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Extent
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Online-Ressource
- Language
-
Englisch
- Bibliographic citation
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In: Journal of physics(1433, 2020)
- Event
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Veröffentlichung
- (where)
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Ilmenau
- (who)
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TU Ilmenau
- (when)
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2020
- Creator
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Sevillano-Bendezú, Miguel Ángel
Dulanto, Jorge A.
Conde, L.A.
Grieseler, Rolf
Guerra, Jorge A.
Töfflinger, Jan Amaru
- DOI
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10.1088/1742-6596/1433/1/012007
- URN
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urn:nbn:de:101:1-2020070603072327793636
- Rights
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
14.08.2025, 11:01 AM CEST
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Sevillano-Bendezú, Miguel Ángel
- Dulanto, Jorge A.
- Conde, L.A.
- Grieseler, Rolf
- Guerra, Jorge A.
- Töfflinger, Jan Amaru
- TU Ilmenau
Time of origin
- 2020
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Voltage induced capacitance variation in high voltage compressed gas capacitors due to electrode flexibility
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