Investigation of ternary nitride semiconductor alloys by scanning tunneling microscopy
- Weitere Titel
-
Untersuchung von ternären Nitrid-Halbleiter-Legierungen mittels Rastertunnelmikroskopie
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
-
Online-Ressource
- Sprache
-
Englisch
- Anmerkungen
-
Jülich : Forschungszentrum Jülich GmbH, Zentralbibliothek, 2017
RWTH Aachen University, Dissertation, 2017
- Erschienen in
-
Schriften des Forschungszentrums Jülich. Reihe Information ; 48
- Klassifikation
-
Physik
- Ereignis
-
Veröffentlichung
- (wo)
-
Aachen
- (wer)
-
Universitätsbibliothek der RWTH Aachen
- (wann)
-
2017
- Urheber
- Beteiligte Personen und Organisationen
-
Ebert, Philipp
Taubner, Thomas Günter
- DOI
-
10.18154/RWTH-2017-04262
- URN
-
urn:nbn:de:101:1-201805082039
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
25.06.2030, 12:49 MESZ
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Beteiligte
- Portz, Verena
- Ebert, Philipp
- Taubner, Thomas Günter
- Universitätsbibliothek der RWTH Aachen
Entstanden
- 2017
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